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Home›Test & Measurement & Inspection›Semiconductor Testing Solution NI PXIe-4143 Source Measure Unit
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Semiconductor Testing Solution NI PXIe-4143 Source Measure Unit

PXIe-4143
★★★★☆4.0 (1 review)
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NI PXIe-4143

High-precision source measure unit for accurate characterization and testing

Brand NI
Model PXIe-4143
Voltage ±200 V
Country of Origin United States
Weight 1.5 kg
Dimensions 230x180x40 mm
Warranty 6 months
Certifications CE, FCC, RoHS
SKU / MPN PXIe-4143
What’s in the box Source Measure Unit, power cable, calibration certificate, user manual
Channels 4
Current Range ±100 mA
Voltage Range ±200 V
Resolution 16-bit
Sampling Rate 1 MS/s
Interface PXIe
Key benefits: High resolution, fast sampling, multiple channels, PXIe integration, compact form factor
Typical applications: Semiconductor testing, battery characterization, sensor testing, materials research
Lifecycle: Active product, 5+ years availability

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